Analog Testability |
| Session Type: Lecture
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| Time: Monday, May 27, 10:30 - 12:00
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| Location: Ballroom H
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| 2289: AN SUBSTRATE NOISE CIRCUIT FOR ACCURATELY TESTING MIXED-SIGNAL ICS |
| Xu, Weize: University of Rochester |
| Friedman, Eby: University of Rochester |
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| 2848: BUILT-IN SELF-TEST SCHEME FOR ON-CHIP DIAGNOSIS, COMPLIANT WITH THE IEEE 1149.4 MIXED-SIGNAL TEST BUS STANDARD |
| Ducoudray, Gladys Omayra: New Mexico State University |
| Ramirez-Angulo, Jaime: New Mexico State University |
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| 1473: A NEURAL NETWORK APPROACH FOR FAULT DIAGNOSIS OF LARGE-SCALE ANALOGUE CIRCUITS |
| He, Yi-Gang : Hunan University |
| Tan, Yang-Hong : Hunan University |
| Sun, Yichuang: University of Hertfordshire |
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| 2785: THE QUALITATIVE FORM OF OPTIMUM TRANSIENT TEST SIGNALS FOR ANALOG CIRCUITS DERIVED FROM CONTROL THEORY METHODS |
| Burdiek, Bernhard: Universität Hannover |
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| 2925: FAULT LOCATION OF SINGLE-PHASE TRANSMISSION LINES BY LAGUERRE FUNCTION |
| YONEMOTO, Akihiro: Kyoto University |
| HISAKADO, Takashi: Kyoto University |
| OKUMURA, Kohshi: Kyoto University |
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