Testing |
| Session Type: Lecture
|
| Time: Monday, May 27, 1:30 - 3:00
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| Location: Salon 7
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| 1685: A METHODOLOGY FOR AUTOMATED INSERTION OF CONCURRENT ERROR DETECTION HARDWARE IN SYNTHESIZABLE VERILOG RTL |
| Mohanram, Kartik: The University of Texas at Austin |
| Chakravadhanula, Krishna: The University of Texas at Austin |
| Touba, Nur: The University of Texas at Austin |
| |
| 1688: AUTOMATED TEST DEVELOPMENT AND TEST TIME REDUCTION FOR RF SUBSYSTEMS |
| Ozev, Sule: University of California San Diego |
| Orailoglu, Alex: University of California San Diego |
| Haggag, Hosam: National Semiconductor |
| |
| 1938: A HEURISTIC DSP BIST INSERTION ALGORITHM WITH MINIMUM AREA OVERHEAD |
| Nassar, Doaa: Mentor Graphics Egypt |
| Salama, Aly: Cairo University |
| |
| 3050: PRACTICAL SOLUTIONS FOR THE APPLICATION OF THE OSCILLATION-BASED TEST IN ANALOG INTEGRATED CIRCUITS |
| Vazquez, Diego: Universidad de Sevilla |
| Huertas, Gloria: Universidad de Sevilla |
| Leger, Gildas: Universidad de Sevilla |
| Rueda, Adoracion: Universidad de Sevilla |
| Huertas, Jose L.: Universidad de Sevilla |
| |
| 1820: LOW-VOLTAGE ANALOG CURRENT DETECTOR SUPPORTING AT-SPEED BIST |
| Dragic, Srdjan: University of Alberta |
| Filanovsky, Igor: University of Alberta |
| Margala, Martin: University of Rochester |
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