Electronic Design for Quality |
| Session Type: Lecture
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| Time: Wednesday, May 29, 1:30 - 3:00
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| Location: Ballroom C
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| 3173: STATIC TIMING ANALYSIS BASED CIRCUIT-LIMITED-YIELD ESTIMATION |
| Gattiker, Anne: IBM |
| Nassif, Sani: IBM |
| Dinakar, Rashmi: IBM |
| Long, Chris: IBM |
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| 3160: REGRESSION CRITERIA AND THEIR APPLICATION IN DIFFERENT MODELING CASES |
| Leyn, Francky: Katholieke Universiteit Leuven |
| Lauwers, Erik: Katholieke Universiteit Leuven |
| Gielen, Georges: Katholieke Universiteit Leuven |
| Sansen, Willy: Katholieke Universiteit Leuven |
| Vogels, Martin: Katholieke Universiteit Leuven |
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| 3157: A NEW METHODOLOGY FOR THE STATISTICAL ANALYSIS OF VLSI CMOS CIRCUITS AND ITS APPLICATION TO FLASH MEMORIES |
| conti, massimo: University of Ancona |
| crippa, paolo: University of Ancona |
| orcioni, simone: University of Ancona |
| pesare, marcello: STMicroelectronics |
| turchetti, claudio: University of Ancona |
| vendrame, loris: STMicroelectronics |
| lucherini, silvia: STMicroelectronics |
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| 3238: MISMATCH-INDUCED TRADEOFFS AND SCALABILITY OF MIXED-SIGNAL VISION CHIPS |
| Rodríguez-Vázquez, Angel: Instituto de Microelectrónica de Sevilla |
| Linan, Gustavo: Instituto de Microelectrónica de Sevilla |
| Espejo, Servando: Instituto de Microelectrónica de Sevilla |
| Dominguez-Castro, Rafael: Instituto de Microelectrónica de Sevilla |
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| 2712: RESISTORS LAYOUT FOR ENHANCING YIELD OF R-2R DACS |
| Lin, Yu : Iowa State University |
| Geiger, Randall: Iowa State University |
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